NSG 3040 (discontinued)

Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfill conducted EMC test requirements for CE mark testing, including Combination Wave Surge (4.4 kV), Electrical Fast Transient (EFT) pulses (4.8 kV) and Power Quality Testing (PQT). Expansion capabilities enable the system to be configured for a much broader range of applications including Telecom Surge 10/700 and Magnetic Field tests.

Featuring an innovative modular design, the NSG 3040 is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

Depending on your exact testing needs, different models are available to ensure the NSG 3040 is configured to your exact testing requirements.

Combination wave pulse 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5

Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4

Dips, Interrupts & Variations
Conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29

Refer to to the NSG 3040 datasheet on the Downloads tab for complete and detailed parameter descriptions.